Sunday, November 5, 2023
``New Challenges in Quantitative Surface Analysis``
There have been many new and exciting advances in surface analysis in recent years. These include the development of hard X-ray sources for laboratory-based HAXPES systems, advancements in characterization under near ambient conditions in both laboratory and synchrotron-based systems, new qualitative capabilities in tandem MS in ToF-SIMS, and many others. With these recent developments come new challenges in quantitative analysis and reproducibility. Through invited speakers and audience participation, this conference will provide opportunities to learn about the capabilities of HAXPES and NAPXPS, and discuss these issues.
Reproducibility and quantification of ToF-SIMS spectra and images are also important but have been rarely discussed in the literature. QSA18 brings back the discussion of the basics of collecting, calibrating, and measuring SIMS data, along with a panel discussion of new developments in ToF-SIMS. Real examples and case studies will be presented with ample time for discussion.
Invited speakers include:
• Alan Spool (Western Digital Corporation): Quantitative TOF-SIMS
• Julia Zakal (IonTOF), Greg Fisher (PHI USA), David Scurr (The University of Nottingham): New developments in ToF-SIMS
• David Cant (NPL): Towards methods for determining sensitivity factors and calibration for HAXPES instruments
• Andreas Thissen (SPECS): Quantification and reporting of XPS data taken under Near Ambient Pressure conditions – chances and challenges in acquisition speed, beam damage, sensitivity, reliability, reproducibility, and repeatability.
Contributed posters are being accepted and encouraged, contact Kateryna Artyushkova (Kateryna_Artyushkova@avs.org) to submit a poster.
*The conference is brought to you by: AVS Applied Surface Science Division