The Applied Surface Science Division (AS) is dedicated to the advancement of surface analysis in a practical context including surface preparation, modification, and utilization of tools for 2D and 3D characterization of surfaces, interfaces, and nanomaterials. The ASSD has long been at the heart of the global community of surface analysts with a historic emphasis on techniques such as XPS, SIMS, and Auger spectroscopies. We have long-standing analytical interests with sessions including quantitative surface analysis, industrial problem solving, multi-modal and multi-dimensional characterization for research and problem-solving. For AVS 69 we are also encouraging contributions in the area of power storage and green energy as well as modeling for data interpretation as applied to surface analysis. Our contributors represent a blend of fundamental research in measurement science, cutting-edge applied studies, industrial problem-solving, and industrial innovation. This year’s theme is “Two is Better than One: Breaking Barriers with Coupled Phenomena”.We accept abstracts for both oral sessions and poster sessions, which provide an excellent opportunity for one-on-one discussions of new results with colleagues. Special consideration will be given to papers that highlight the utilization of coupled phenomena in their research.
AS1+CA+EL+EM+SE+SS+TF: Quantitative Surface Analysis
- Kelsey Stoerzinger, Oregon State University
AS2+2D+CA+EM+MS+NS+SE+SS+TF: Multi-Modal & Multi-Dimensional Analysis
- Glenn Jernigan, US Naval Research Laboratory, “Growth and Characterization of Large-Area 2D Materials”
AS3+2D+CA+EM+MS+NS+SE+SS+TF: Power Storage & Green Energy
- Cecile Courreges, University of Pau / iPREM, France, “In-situ Surface Analysis Techniques for the Investigation of All-Solid-State Lithium-Ion Batteries Cycling”
AS4+2D+CA+EM+NS+SE+SS+TF: Modelling in Applied Surface Analysis
- Marko Sturm, University of Twente, Netherlands, “Probing Thin Film Interfaces at the Nanoscale by Low Energy Ion Scattering”
AS5+2D+CA+EM+MS+NS+SE+SS+TF: Industrial Applications
- Jean-Paul Barnes, CEA-LETI, France, “Correlating TOF-SIMS with Other Surface Analysis and Microscopy Techniques for Microelectronics and Energy Applications”
AS6+CA+EL+EM+SE+SS+TF: Quantitative Surface Analysis
AS7+2D+CA+EM+MS+NS+SE+SS+TF: Multi-Modal & Multi-Dimensional Analysis
AS8+2D+CA+EM+MS+NS+SE+SS+TF: Power Storage & Green Energy
AS9+2D+CA+EM+MS+NS+SE+SS+TF: Modelling in Applied Surface Analysis
AS10+2D+CA+EM+MS+NS+SE+SS+TF: Industrial Applications
AS11: Applied Surface Science Poster Session