The Advanced Focused Ion Beams focus topic targets advancement in focused ion beam technologies and applications. The renaissance of novel ion beam technologies in recent years brought unique opportunities in microscopy, nano-fabrication, metrology, material engineering, and novel analytical techniques. This session includes the full spectrum of charged particle beams and sources including Gas Field Ion Sources (GFIS) Liquid Metal Ion Sources (LMIS), a breadth of solid state and alloy sources, plasma-cusp ion sources, cold beams, and neutral beams, for a broad range of research and applications. The applications include advanced in-situ focused ion beam material modifications and patterning, sophisticated capabilities for electron microscopy and atom probe tomography sample preparation capabilities, and advanced ion microscopy and imaging.
IB1: Advances in FIB instrumentation, Ion Sources, and Optics
- Nico Klingner, Helmholtz Zentrum Dresden-Rossendorf, Germany
IB2: Beam Induced Material Engineering and Nano Patterning
- Philip Rack, University of Tennessee, “Modeling and Experimental Demonstrations of Ion-Solid-Gas and Photon Beam Interactions During Nanoscale Synthesis”
IB3: In Situ FIB Applications
- Peter Hosemann, University of California Berkeley
IB4: Advanced Ion Microscopy and Surface Analysis
- Antje Biesemeier, Luxembourg Institute of Science and Technology (LIST), Luxembourg, “Multimodal Characterisation of Biological Samples on FIB Instruments Combining Nano-Scale SIMS, SE and STIM Imaging Under Ambient and Cryogenic Conditions”
IB5: Advances in TEM and APT Specimen Preparation
- Bharat Gwalani, North Carolina State University
IB6: Ion Beam Imaging, Cross-sectioning, and Tomography
- Valerie Brogden, Oregon State University
IB7: Advanced Focused Ion Beams Poster Session