Advanced Focused Ion Beams focus topic targets advancement in focused ion beam technologies and applications. The renaissance of novel ion beam technologies in recent years brought unique opportunities in microscopy, nano-fabrication, metrology, material engineering, and novel analytical techniques. This session includes the full spectrum of charged particle beams and sources including Gas Field Ion Sources (GFIS) Liquid Metal Ion Sources (LMIS), a breadth of solid state and alloy sources, plasma-cusp ion sources, cold beams, and neutral beams, for a broad range of research and applications. The applications include advanced in-situ focused ion beam material modifications and patterning, sophisticated capabilities for electron microscopy and atom probe tomography sample preparation capabilities, and advanced ion microscopy and imaging.
IB-ThM: Advances in FIB Instrumentation, Source, Optics, and Surface Analysis
- Antje Biesemeier, Luxembourg Institute of Science and Technology (LIST), Luxembourg, “Multimodal Characterization of Biological Samples on FIB Instruments Combining Nano-Scale SIMS, SE and STIM Imaging Under Ambient or Cryogenic Conditions”
- Nico Klingner, Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden – Rossendorf (HZDR), Germany, “TIBUSSII – the First Triple Beam Single Ion Implantation Setup for Quantum Applications”
IB-ThA: In Situ FIB Applications
- Peter Hosemann, University of California at Berkeley, Lawrence Berkeley National Laboratory, “Surface Near Helium Damage in Materials Studied with a High Throughput Implantation Method”
Michael Meindlhumer, Montanuniversität Leoben, Austria, “Evolution of Stress Fields During Crack Growth and Arrest in Micro-Cantilevers During in Situ Bending”
IB1-FrM: Advances in FIB Specimen Preparation
- Valerie Brogden, University of Oregon, “A Multi-Scale Understanding of the Three-Dimensional Microstructure of the Cornea Using Oxygen Plasma Focused Ion Beam, Scanning Transmission Electron Microscopy and Micro-CT Techniques”
IB2-FrM: Advances in TEM and APT Specimen Preparation
- Bharat Gwalani, Engineering Bldg I 911 Partners Way, “Correlative and In Situ TEM/APT Technique Reveals Insights into Early Oxide Film Formation in a High Entropy Alloy”
IB3-FrM: Beam-Induced Defect and Material Engineering
- Philip Rack, University of Tennessee, United States Minor Outlying Islands (the), “Modeling and Experimental Demonstrations of Ion-Solid-Gas and Photon Beam Interactions During Nanoscale Synthesis”
IB-ThP: Advanced Focused Ion Beams Poster Session